The following presentation has been selected as the 44th NANO Testing Symposium (NANOTS2024) Best Interested Paper Award and Best Commercial Session Presenter Award.
Best Interested Paper Award
- Paper: (13)
- Title:
- Evaluation of EBAC sensitivity improvement using lock-in amplifier
- Author:
- Y. Katakura, M. Tsujita, T. Kawamura
- Affiliation:
- Sony Semiconductor Manufacturing Corporation
Best Commercial Session Presenter Award
- Paper: (C9)
- Title:
- Visualization of p-n junctions of SiC devices using “Spectrum Image” using the Auger Electron Spectrometer (JAMP-9510F)
- Author:
- K. Ikita, F. Nabeshima, K. Tsutsumi
- Affiliation:
- SA business Unit, JEOL Ltd.
